Machine learning classification and training for digital microscopy images
US10255693B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 2, 2017 |
| Grant date | Apr 9, 2019 |
| Priority date | — |
| Expiry date | May 31, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20081
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, and devices for training models or algorithms for classifying or detecting particles or materials in microscopy images are disclosed. A method includes receiving a plurality of microscopy images of a specimen and a classification for the specimen. The plurality of microscopy images includes a first image captured at a first magnification and a second image captured at the first magnification with a different focus than the first image. The method includes training a machine learning model or algorithm using the plurality of images, wherein the first image and the second image are provided with one or more labels indicating the classification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.