Support structure and highly aligned monochromatic X-ray optics for X-ray analysis engines and analyzers
US10256002B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 26, 2016 |
| Grant date | Apr 9, 2019 |
| Priority date | — |
| Expiry date | Oct 26, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.