Generation of diffraction signature of item within object
US10261212B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2013 |
| Grant date | Apr 16, 2019 |
| Priority date | — |
| Expiry date | Jul 5, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/0566
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A diffraction system configured to generate a diffraction signature based upon an angular disbursement of radiation is provided. In some embodiments, the diffraction system comprises a radiation source comprising a radiographic isotope configured to natural emit radiation due to decay. In some embodiment, the diffraction system is part of an object identification system that comprises one or more other radiation imaging modalities, such as a CT system and/or a line-scan system. By way of example, the one or more other radiation imaging modalities may perform an initial examination of an object to generate data indicative of the object. The data can be analyzed to identify an item of interest within the object, which can subsequently be examined by the diffraction system to generate a diffraction signature of the item. The diffraction signature of the item can be compared to known diffraction signatures of know items to characterize the item.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.