Patent · US Active

TCAM soft-error detection method and apparatus

US10261858B2 · kind B2 · utility

0Cited by

0References

22Claims

0Family size

Assignee

Intel Corporation · US

Inventors

Yevgeny Yankilevich · Tirat Karmel, IL
Gal Malchi · Bat Yam, IL

Key dates

Filing date	Dec 24, 2016
Grant date	Apr 16, 2019
Priority date	—
Expiry date	Dec 24, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/10
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Apparatuses, methods and storage medium associated with techniques to detect soft errors of a TCAM are disclosed herein. In embodiments, an apparatus may include a TCAM, and logic and/or circuitry to apply a plurality of fault detection patterns to the TCAM to generate respective hit output arrays for the plurality of fault detection patterns, generate parity signatures for the hit output arrays, and compare the generated parity signatures to expected parity values. Other embodiments may be disclosed or claimed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.