Measuring frame loss
US10263867B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2015 |
| Grant date | Apr 16, 2019 |
| Priority date | — |
| Expiry date | Nov 15, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L49/552
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A method for measuring frame loss on a connection between a near-device (NED) and a far-end device (FED). The method includes: placing, on the connection, multiple test frames having a plurality of sequence numbers; obtaining, from the connection, a first reflected test frame having a first sequence number, a first FED receiving counter value from the FED, and an initial FED received count from the FED; obtaining, from the connection, a second reflected test frame having a second sequence number, a second FED receiving counter value from the FED, and the initial FED received count from the FED; and calculating a one-way frame loss value on the connection based on the second sequence number and the initial FED received count.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.