Method and apparatus for detecting defects on tyres in a tyre production process
US10267710B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2014 |
| Grant date | Apr 23, 2019 |
| Priority date | — |
| Expiry date | May 5, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/32368
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting defects on tires in a tire production process includes providing a tire; acquiring a three-dimensional image of a surface portion of the tire; generating, as a function of the acquired image, a plurality of values indicating the measure of a height profile of the surface portion of the tire; calculating, as a function of the plurality of values of the measure of the height profile and according to a consensus interpolation, a plurality of values indicating an estimation of a reference height profile of the surface portion of the tire; calculating, as a function of the plurality of values of the measure of the height profile and of the estimation of the reference height profile, a height profile of possible defects in the surface portion of the tire; and comparing values of the height profile of possible defects with respect to a threshold value in order to detect possible defects in the surface portion of the tire.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.