Surface profile measurement system
US10267725B2 · kind B2 · utility
3Cited by
16References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 23, 2018 |
| Grant date | Apr 23, 2019 |
| Priority date | — |
| Expiry date | May 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for measuring surface profiles within passages such as the interiors of pipes, tubing, casing or the like includes an optical scanning system that acquires digital data that directly identifies the surface profiles. A temperature control system facilitates operation in high temperature environments. The optical scanning system may include a camera located between a light source and a conical mirror. Light deflecting elements may guide light from the light source to the conical mirror along a path that reverses direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.