X-ray phase-contrast imaging system and imaging method

US10267752B2 · kind B2 · utility

Assignees

• TSINGHUA UNIVERSITY · CN
• NUCTECH COMPANY LIMITED · CN

Inventors

• Li Zhang · Beijing, CN
• Zhiqiang Chen · Beijing, CN
• Xiaolei JIANG · Beijing, CN
• Xiaohua Zhu · Sichuan, CN
• Xin Jin · Beijing, CN

Key dates

• Filing date: Nov 2, 2015
• Grant date: Apr 23, 2019
• Expiry date: Feb 15, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present disclosure relates to X-ray imaging systems and methods. An exemplary system may comprise a distributed X-ray source arrangement, a fixed grating module, an X-ray detecting device, and a computer workstation. In one illustrative implementation, X-ray sources of the distributed incoherent X-ray source arrangement may sequentially generate and emit X-rays to an object to be detected. Further, for each exposure, the X-ray detecting device may receive the X-rays, wherein after a series of stepping exposures and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve; the intensity curve may be compared to an intensity curve in the absence of the object to be detected, and a pixel value at each pixel may be obtained from a variation of the intensity curves; and image information of the object to be detected may be obtained according to such pixel values.