Patent · US Active

Ionization chamber, ion-implantation apparatus and ion-implantation method

US10269542B2 · kind B2 · utility

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17Claims
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Assignee

Inventor

Key dates

Filing dateJul 26, 2017
Grant dateApr 23, 2019
Priority date
Expiry dateAug 19, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32412
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An ionization chamber includes a cavity in which an air supply pipe and a filament are located. The air supply pipe is bent to form a closed frame in which the filament is accommodated. The filament is energized to generate hot electrons. The air supply pipe has an air outlet on one side facing the filament for outputting an ion-source gas. The ion-source gas collides with the hot electrons to produce plasma. Also disclosed are an ion-implantation apparatus and an ion-implantation method. Because the ion-source gas collides with the hot electrons uniformly, the plasma concentration at each position in the cavity is uniform; the ion-implantation effect is improved. During the process of the uniformity of the plasma concentration, the regulation about frequency of current of the filament is reduced, then the filament's life is increased, the equipment maintenance cycle is extended, the display equipment production cost is reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.