System for testing thermal response time of uncooled infrared focal plane detector array and method therefor

US10274376B2 · kind B2 · utility

Assignee

• University of Electronic Science and Technology of China · CN

Inventors

• Ziji Liu · Sichuan, CN
• Shengchen Zhao · Sichuan, CN
• Zhiqing Liang · Sichuan, CN
• Hongbo Zhang · Baofeng County, CN
• Tao Wang · Beijing, CN
• Yadong Jiang · Sichuan, CN

Key dates

• Filing date: May 2, 2018
• Grant date: Apr 30, 2019
• Expiry date: May 2, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J5/80
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for testing thermal response time of an uncooled infrared focal plane detector array and a method therefor is provided. The system comprises: a blackbody, a chopper, a detector unit under test and a testing system. The method comprises: emitting radiation by the blackbody, chopping by the chopper, then radiating the radiation to the uncooled infrared focal plane detector array under test; generating different responses on the radiation at different chopping frequencies by the uncooled infrared focal plane detector array under test; collecting different response values of the uncooled infrared focal plane detector array under test at different chopping frequencies; obtaining response amplitude at a corresponding frequency in a frequency domain by FFT; fitting according to a formula to obtain the thermal response time.