Device for inspecting by interferometry
US10274397B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2016 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Jun 24, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/3885
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Device for inspecting by interferometry the geometry of an end face of a ferrule of a multi-fiber optic connector. The device allows the ferrule to be held by a holder of the ferrule, and a supporting plate including a receiving device adopts a position in space that is mainly conditioned by the interaction of the receiving device of the supporting plate with an engagement device provided on the ferrule. The supporting plate includes a reference surface with respect to which is measured by interferometry the geometry of the end face of the ferrule, the position of this reference surface being preset with respect to the orientations of the receiving device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.