Optical line testing device using wavelength tunable laser to measure cutting position of optical line
US10274398B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 22, 2015 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Dec 22, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3145
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An optical line testing device for measuring at least a cutting position of an optical line according to the present invention includes: a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically; a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time; and an interferometer configured to cause interference between a reflected optical signal, corresponding to the first optical signal, which is returning after having been emitted to the optical line, and the second optical signal to output an interference signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.