Particle processing systems and methods for normalization/calibration of same
US10274414B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 19, 2014 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Dec 2, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1402
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods and non-transitory storage medium are disclosed herein for adjusting an output of a particle inspection system representative of a particle characteristic for a particle flowing in a flow-path of a particle processing system. More particularly, the output may be processed and a calibrated output of the particle characteristic generated. In other embodiments, one or more calibration particles are used. Thus, an output of a particle inspection system representative of a particle characteristic for one or more calibration particles flowing in a flow-path of a particle processing system may be compared relative to a standard and an action may be taken based on a result of the comparing the output to the standard.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.