Patent · US Active

Determining functional data of an X-ray detector

US10274608B2 · kind B2 · utility

1Cited by

2References

22Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Christian Schroeter · Bamberg, DE
Peter Sievers · Uttenreuth, DE

Key dates

Filing date	Jan 21, 2016
Grant date	Apr 30, 2019
Priority date	—
Expiry date	Jul 23, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01T7/005
WIPO fieldEnvironmental technology
WIPO sectorChemistry

Abstract

A method is described for determining the polarization state of a sensor of an X-ray detector. In the method, the X-ray detector is illuminated with a sequence of light pulses wherein the individual pulses of the light pulse sequence have a different intensity. It is further determined at what intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit. Also described is a method for obtaining and/or setting functional data of a sensor of an X-ray detector and/or of a sensor illumination unit. Furthermore, an X-ray detector is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.