Run time test workload customer profiling baselines visualization
US10275340B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2017 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Feb 6, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects of the present invention include a method, system and computer program product. The method includes obtaining, by a processor, customer data relating to a software workload environment of a customer, and obtaining, by the processor, test data relating to a test of a software system. The method also includes comparing, by the processor, the obtained customer data with the obtained test data to determine one or more statistical measures between the obtained customer data and the obtained test data, and displaying, by the processor, the determined one or more statistical measures between the obtained customer data and the obtained test data. The method further includes wherein the customer data contains multiple data points arranged in groups of analysis points, and wherein the test data contains multiple data points arranged in groups of analysis points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.