Multi-year crop yield analysis using remotely-sensed imagery for missing or incomplete yield events for site-specific variable rate applications
US10275731B2 · kind B2 · utility
1Cited by
3References
20Claims
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Key dates
| Filing date | Jul 6, 2017 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Jul 6, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02A40/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A multi-year yield analysis in precision agriculture characterizes variables affecting crop yield to enable site-specific prescription mapping for a bounded field. Remotely-sensed imagery of the bounded field is incorporated as a replacement for, or in addition to, one or more of coverage data, uniformity data, age data, and weather data that comprise variables in the multi-year yield analysis. The multi-year yield analysis enables recommendations for variable-rate applications to the bounded field such as seeding, fertilizing, and applying crop treatments.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.