Method and apparatus for detecting defects on the surface of tyres
US10275874B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2016 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Jun 21, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and related apparatus for detecting defects on a surface of a tire, include: providing the tire; acquiring a digital image including a structure including sections representative of linear elements of a pattern in a surface portion and representative of possible elongated defects, the sections of the structure having a respective orientation; providing a model of the pattern in the surface portion, wherein each pixel is associated with a first index representative of whether the pixel belongs or not to a pattern section and a second index representative of an at least local orientation of the pattern section passing through the pixel; calculating for each pixel of the structure a third index representative of the orientation of the structure section passing through the pixel; and establishing, for each pixel of the structure having a corresponding pixel in the pattern model belonging to the pattern, whether the pixel of the structure belongs to a proposed defect on the basis of the comparison between the third index and the second index associated with the corresponding pixel in the pattern model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.