Array substrate, its manufacturing method and testing method, and display device
US10276456B2 · kind B2 · utility
1Cited by
1References
5Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Aug 12, 2016 |
| Grant date | Apr 30, 2019 |
| Priority date | — |
| Expiry date | Sep 9, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/60
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The present disclosure provides an array substrate, its manufacturing method and testing method, and a display device. The array substrate includes a (Test Element Group) TEG arranged at a non-display area and including a plurality of to-be-tested elements and a plurality of testing contact electrodes configured to test the to-be-tested elements. Each of the to-be-tested elements is connected to at least two of the testing contact electrodes, and at least one of the testing contact electrodes is shared by at least two of the to-be-tested elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.