Darkroom type security inspection apparatus and method
US10281431B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 21, 2016 |
| Grant date | May 7, 2019 |
| Priority date | — |
| Expiry date | Jun 10, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention discloses darkroom type security inspection apparatus and method. An apparatus comprises a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing are communicated by fittings or connectors and comprises: a sampling assembly comprising a sample collecting unit and a conveyer unit configured to convey an object to be inspected into the sample collecting unit; a sample processing assembly configured to concentrate and analyze the sample; and, an inspecting assembly configured to inspect composition of the sample by means of a gas chromatographic-ion mobility spectrometer (GC-IMS) or a separated ion mobility spectrometer (IMS). The security inspection apparatus of the present invention can perform the sampling easy, rapidly and effectively and perform the inspection accurately and rapidly without destroying and unpacking an object to be inspected, and thus is suitable for requirements of on-site rapid inspection of forbidden items in the airport, customs and the likes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.