Raman spectroscopy system
US10295408B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2016 |
| Grant date | May 21, 2019 |
| Priority date | — |
| Expiry date | Jun 1, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/4424
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectroscopy system (10) for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly (13) having a tunable lens provided in the beam path between an electromagnetic radiation source (11) and the object (0) and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on electromagnetic radiation detected by at least a first detector (121) a control unit (14) is capable making a decision to change the operational settings of the tunable lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.