Test socket for semiconductor device and test device including the same
US10295563B2 · kind B2 · utility
0Cited by
17References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 19, 2015 |
| Grant date | May 21, 2019 |
| Priority date | — |
| Expiry date | Jul 13, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2863
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are a test socket for a semiconductor device and a test device including the test socket. The test device includes a test socket including terminals arranged in a two-dimensional array and corresponding to terminals of the semiconductor device and a ground line extending along at least one row of two-dimensional array; and a substrate electrically connected to the test socket so as to transmit and receive a test signal. The test socket includes a ground line extending along at least one row of the two-dimensional array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.