Segmentation and spectrum based metal artifact reduction method and system
US10297048B2 · kind B2 · utility
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Key dates
| Filing date | Oct 28, 2016 |
| Grant date | May 21, 2019 |
| Priority date | — |
| Expiry date | Apr 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/408
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A segmentation-and-spectrum-based metal artifact reduction (MAR) system and method is applied in polychromatic X-ray CT system that uses a priori knowledge of high-Z metals in samples which contribute the primary artifacts at a known x-ray energy spectrum. Using a basis materials decomposition, the method solves the problem of reducing or eliminating metal artifacts associated with beam hardening using only a single scan of the sample performed at selected x-ray energy.
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