Patent · US Active

Calibration method, calibration device and measurement device

US10302468B2 · kind B2 · utility

1Cited by
7References
15Claims
0Family size

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Inventors

Key dates

Filing dateFeb 7, 2013
Grant dateMay 28, 2019
Priority date
Expiry dateFeb 13, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

According to an aspect of the invention a method for calibrating a measurement device is conceived wherein: a calibration device is brought into close proximity of the measurement device such that a data communication link is established between the measurement device and the calibration device; wherein the following steps are performed while the calibration device and the measurement device are in close proximity of each other: the calibration device performs a measurement of at least one physical phenomenon; the measurement device performs a measurement of the same physical phenomenon; the result of the measurement by the measurement device is compared with the result of the measurement by the calibration device; and calibration parameters are computed based on a difference between the result of the measurement by the measurement device and the result of the measurement by the calibration device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.