Patent · US Active

Method and device for the thermal analysis of a sample and/or for the calibration of a temperature measuring device

US10302497B2 · kind B2 · utility

1Cited by

1References

14Claims

0Family size

Assignee

NETZSCH-Gerätebau GmbH · DE

Inventors

Martin Brunner · Pforzheim, DE
Alexander Schindler · Selbitz, DE
André Lindemann · Merseburg, DE

Key dates

Filing date	Dec 14, 2016
Grant date	May 28, 2019
Priority date	—
Expiry date	Jun 2, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01J5/80
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a device for the thermal analysis of a sample, as well as a method and a device for the calibration of a temperature measuring device used in a device for the thermal analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.