Aspirated sampling systems
US10302522B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 6, 2015 |
| Grant date | May 28, 2019 |
| Priority date | — |
| Expiry date | Mar 6, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N1/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining correct performance of a sampling pipe in an aspirated particle and/or gas sampling system. The method includes causing a change in airflow in a sampling pipe of the aspirated particle and/or gas sampling system that induces a change in at least one airflow property within the sampling pipe, and detecting an effect of the change in said airflow property. Also disclosed is a method for determining correct performance of an aspirated particle gas sampling system. The method includes determining correct performance of a sampling pipe in the aspirated particle and/or gas sampling and determining correct performance of a detector in the aspirated particle and/or gas sampling system, wherein a test fluid is introduced to the aspirated particle and/or gas sampling system at or near the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.