Generation source analyzing device and generation source analyzing method
US10302610B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2017 |
| Grant date | May 28, 2019 |
| Priority date | — |
| Expiry date | Nov 25, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.