Patent · US Active

Measurement system

US10302685B2 · kind B2 · utility

1Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 14, 2017
Grant dateMay 28, 2019
Priority date
Expiry dateDec 20, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B17/29
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement system including an anechoic chamber, a turntable, N measurement antennas, in which N is a natural number and N≥11, in which a spherical coordinate system is established by taking a center of a measured piece as an origin and a coordinates of the i (i=1, 2, 3, . . . , N) measurement antenna is Ai(ρi, θi, φi), (i=1, 2, 3, . . . , N), in which θi is a positive integral multiple of 15°, and at least one measurement antenna is arranged at a position where the angle θis 15°, 30°, 30°, 45°, 60°, 75°, 90°, 105°, 120°, 135°, 150° or 165° correspondingly; and 0≤φi≤360°, and the N measurement antennas are not located in the same plane. The present disclosure can create a measurement environment with small coupling interference and low reflection between the measurement antennas in a relatively small anechoic chamber, improving the measurement accuracy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.