Identifying and repairing defects for micro-device integrated systems
US10304364B2 · kind B2 · utility
2Cited by
2References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 22, 2016 |
| Grant date | May 28, 2019 |
| Priority date | — |
| Expiry date | May 25, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49128
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.