Calibrating method and device for broad-band achromatic composite wave plate and corresponding measurement system
US10309834B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2016 |
| Grant date | Jun 4, 2019 |
| Priority date | — |
| Expiry date | May 9, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure discloses a calibrating method, apparatus, and corresponding measurement system for a composite waveplate. The calibrating method comprises: A. determining a first matrix characterizing the composite waveplate, the first matrix including at least one unknown number; B. determining a theoretical relationship between a light intensity and an alignment angle offset value of the composite waveplate based on the first matrix; and C. calibrating based on the theoretical relationship between a light intensity and an alignment angle offset value of the composite waveplate determined in step (B) and actually measured light intensity data to obtain a second matrix that may characterize the composite waveplate and does not contain the unknown number. The technical solution of the present disclosure may greatly reduce the amount of unknown numbers when calibrating a composite waveplate or a measuring system, thereby lowering the difficulty of calibration and improving the precision of calibration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.