Apparatus and method for analysing a surface
US10317345B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 21, 2015 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Dec 21, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for analyzing a surface which, in use, is subject to drag, the apparatus comprising, a light source for generating light of at least one predetermined wavelength, a light source holder for holding and positioning the light source so as to direct it at the surface, a light detector for detecting reflected light from the surface and generating a signal in response thereto, a light detector holder for holding the light detector and positioning it so as to detect the reflected light, and a connector for connecting the light detector to a microprocessor to analyze the signal. Also disclosed is a method of analyzing a surface which, in use, is subject to drag.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.