Patent · US Active

Apparatus and method for analysing a surface

US10317345B2 · kind B2 · utility

1Cited by
3References
21Claims
0Family size

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Key dates

Filing dateDec 21, 2015
Grant dateJun 11, 2019
Priority date
Expiry dateDec 21, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/06113
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for analyzing a surface which, in use, is subject to drag, the apparatus comprising, a light source for generating light of at least one predetermined wavelength, a light source holder for holding and positioning the light source so as to direct it at the surface, a light detector for detecting reflected light from the surface and generating a signal in response thereto, a light detector holder for holding the light detector and positioning it so as to detect the reflected light, and a connector for connecting the light detector to a microprocessor to analyze the signal. Also disclosed is a method of analyzing a surface which, in use, is subject to drag.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.