Deployment mechanism for passive normalization of a probe relative to a surface
US10317372B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 1, 2018 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Jun 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2634
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present apparatus is configured to carry an instrument or probe and optionally deploy it against a surface, such as a metal pipeline or storage tank. The apparatus can include a sensor probe for inspecting the integrity of the surface and a first linkage that is operatively coupled to the sensor probe and configured to move the sensor probe according to a first path (in a first direction/first degree of freedom). An actuator can be operatively connected to the first linkage for moving the first linkage so as to move the sensor probe along the first path. A second linkage is operatively connected to the sensor probe and configured to passively move the sensor probe according to a second degree of freedom to cause the sensor probe to become normal to the surface when at least a portion of the apparatus contacts the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.