Surface plasmon resonance in thin films
US10317580B2 · kind B2 · utility
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8Claims
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Key dates
| Filing date | Aug 8, 2012 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Aug 8, 2032 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC23C14/34
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
A thin film comprising a layer of dielectric material having electrically conductive inclusions, wherein the thin film has a first reflectivity due to surface plasmon resonance, and wherein the thin film is configured to provide one or more selected regions having a second reflectivity due to surface plasmon resonance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.