Patent · US Active

Light-field microscopy with phase masking

US10317597B2 · kind B2 · utility

0Cited by
30References
20Claims
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Assignee

Inventors

Key dates

Filing dateAug 17, 2015
Grant dateJun 11, 2019
Priority date
Expiry dateJun 10, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/0075
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Various aspects of the present disclosure are directed toward optics and imaging. As may be implemented with one or more embodiments, an apparatus includes one or more phase masks that operate with an objective lens and a microlens array to alter a phase characteristic of light travelling in a path from a specimen, through the objective lens and microlens array and to a photosensor array. Using this approach, the specimen can be imaged with spatial resolution characteristics provided via the altered phase characteristic, which can facilitate construction of an image with enhanced resolution.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.