Determination of deflection of a microscope slide
US10317663B2 · kind B2 · utility
0Cited by
7References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 27, 2015 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Dec 3, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/244
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The present approach relates to the measure of the planar tilt of a slide on a microscope using an integrated auto-focuser. The tilt of the slide can be used to detect improperly loaded slides (i.e. if the slide is resting on either the cover-slip or a printed barcode), compensate for misalignment between the microscope optical axis and the slide, and reduce subsequent focusing times.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.