Machine learning method and machine learning device for learning fault conditions, and fault prediction device and fault prediction system including the machine learning device
US10317853B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 27, 2016 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Dec 23, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S901/47
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A fault prediction system includes a machine learning device that learns conditions associated with a fault of an industrial machine. The machine learning device includes a state observation unit that, while the industrial machine is in operation or at rest, observes a state variable including, e.g., data output from a sensor, internal data of control software, or computational data obtained based on these data, a determination data obtaining unit that obtains determination data used to determine whether a fault has occurred in the industrial machine or the degree of fault, and a learning unit that learns the conditions associated with the fault of the industrial machine in accordance with a training data set generated based on a combination of the state variable and the determination data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.