Methods for the analysis of high resolution melt curve data
US10318705B2 · kind B2 · utility
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Key dates
| Filing date | May 19, 2016 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Apr 27, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16B40/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present application provides for various embodiments of methods for the analysis of high resolution melt (HRM) curve data; where statistical assay variations in melt curve data may result from system noise in an analysis system. Such system noise may arise from various sources, such as the thermal non-uniformity of a thermocycler block in a thermal cycler apparatus, a detection system, etc. Additionally, various methods for the analysis of HRM curve data may provide an identification of a sample without the need for a user inputted information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.