Placement-driven generation of error detecting structures in integrated circuits
US10325049B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2017 |
| Grant date | Jun 18, 2019 |
| Priority date | — |
| Expiry date | Mar 11, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2117/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to one or more embodiments, a method for adding parity protection for any uncovered latches of a circuit design is provided. The method includes determining latches that are not covered by current parity protection of the circuit design to output a list of the uncovered latches. The method includes executing a clustering operation that iteratively generates latch groupings according to physical design information and clock gating domains, and that outputs an updated design incorporating the latch groupings. Note that each latch grouping generates a corresponding parity bit to provide the parity protection to minimize adverse impacts on timing, routing, and power consumption of the circuit design. The method also includes adding the updated design with the parity protection to the circuit design to generate a final hardware design.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.