Patent · US Active

Test element analysis system for the analytical examination of a sample

US10328429B2 · kind B2 · utility

0Cited by

3References

16Claims

0Family size

Assignee

Roche Diagnostics Operations, Inc. · US

Inventors

Reiner Stein · Bad Kreuznach, DE
Lars Fischheiter · Ludwigsburg, DE
Martin Mertens · Schriesheim, DE

Key dates

Filing date	Oct 3, 2017
Grant date	Jun 25, 2019
Priority date	—
Expiry date	Feb 15, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N33/4875
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test element analysis system for the analytical examination of a sample, a method for positioning a test element in a measuring device and a method for an analytical examination of a sample are disclosed. The test element analysis system comprises: a measurement device comprising a test element receptacle for receiving a test element at least partially, wherein the receptacle comprises a first part and a second part, the first part comprises a support surface for placement of the test element, the second part comprises an alignment pin for engagement with an alignment hole of the test element, the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, the receptacle is configured to position the second part in at least three distinct positions relative to the first part comprising an intermediate position, a closed position, and an open position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.