Cu—Ga—In—Na target
US10329661B2 · kind B2 · utility
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9Claims
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Key dates
| Filing date | Jan 29, 2014 |
| Grant date | Jun 25, 2019 |
| Priority date | — |
| Expiry date | Sep 25, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/541
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
A sputtering target is composed of an alloy consisting of 5 to 70 at % of at least one element from the group of (Ga, In) and 0.1 to 15 at % of Na, the remainder being Cu and typical impurities. The sputtering target includes at least one intermetallic Na-containing phase.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.