Patent · US Active

Method and apparatus for obtaining a maximally compressed verification test set

US10330728B2 · kind B2 · utility

1Cited by

7References

18Claims

0Family size

Assignee

SAMSUNG ELECTRONICS CO., LTD. · KR

Inventors

Mrinal Bose · Austin, US
James T. Longino · Austin, US
Laxmi Narayana Yakkala · Austin, US

Key dates

Filing date	Jul 17, 2015
Grant date	Jun 25, 2019
Priority date	—
Expiry date	Nov 4, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for minimizing a test set for optimal coverage is disclosed. The method includes generating a first test set which is both an empty and minimal test set. Then, generating a second test set with a predetermined number of tests. Further, partitioning the second test set into a control test set and an experiment test set. Subsequently, providing a list of tests for coverage by merging the control test set with the first test set to form a merged list of sets.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.