Deformation analysis device, deformation analysis method, and program
US10331809B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 2013 |
| Grant date | Jun 25, 2019 |
| Priority date | — |
| Expiry date | Jan 31, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/14
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The deformation analysis device includes: a storage unit (12) which stores analysis data of a material; a state variable calculating unit (152) which calculates stresses and other state variables of respective elements of the material at each point in time of deformation of the material, based on the analysis data; a fracture determining unit (153) which, based on the calculated state variables, determines whether or not a fracture has occurred in each of the elements of the material, based on a fracture limit stress curve which is found in advance for the material; and a stress correcting unit (154) which, regarding an element in which it is determined that the fracture has occurred, out of the elements of the material, reduces σ by the following expression σ=(1−D)σ′ where σ is a stress with a rigidity decrease taken into consideration, D is a damage variable (note that 0≤D≤1) in continuum damage mechanics, and σ′ is a stress with the rigidity decrease not taken into consideration, to thereby decrease rigidity of the relevant element, without eliminating the element, and updates the analysis data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.