Patent · US Active

Measuring system and method for calibrating printing stations

US10336109B2 · kind B2 · utility

1Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 2015
Grant dateJul 2, 2019
Priority date
Expiry dateMay 15, 2036

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB41F33/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement system includes a measurement device to detect measurement information relating to a position-modifiable component of a printing station during movement thereof. A calculation unit receives the measurement information from the measurement device. The calculation unit determines actual-position data of the position-modifiable component from the measurement data received and compares it with predetermined reference-position data to determine calibration information based on the actual-position data and the reference-position data. An interface permits then permits transfer of this calibration information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.