Method and X-ray inspection system, in particular for non-destructively inspecting objects

US10338269B2 · kind B2 · utility

Inventors

• Pia Dreiseitel · Eschborn, DE
• Sebastian König · Wiesbaden, DE
• Andreas Mader · Heidelberg, DE
• Dirk Naumann · Lorsch, DE
• Jörg Nittikowski · Bärnau, DE

Key dates

• Filing date: Jan 16, 2015
• Grant date: Jul 2, 2019
• Expiry date: May 14, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01V5/226
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

This disclosure relates to methods for non-destructively inspecting an object, wherein electromagnetic radiation is passed through the object and intensity values of unabsorbed beams are measured and evaluated. The method can include generating a three-dimensional data set in which a first material property of the object is associated with individual spatial elements of the object using computed tomography; determining an inspection space, in the three-dimensional data set; deriving values, based on the three-dimensional data set, corresponding to a spatial geometric quantity of the inspection space in a predetermined projection direction; generating a two-dimensional data set in which a second material property of the object is associated with individual surface elements of the object, using two-dimensional X-ray; determining an inspection region in the two-dimensional data set by computing a projection of the inspection space into the two-dimensional data set; and transferring the derived values into corresponding surface elements of the projection.