Patent · US Active

Test automation using multiple programming languages

US10339036B2 · kind B2 · utility

4Cited by

0References

20Claims

0Family size

Assignee

ACCENTURE GLOBAL SOLUTIONS LIMITED · IE

Inventors

Anurag Dwarakanath · Bengaluru, IN
Dipin Era · Thalassery, IN
Subani Basha Nure · Bengaluru, IN
Neville Dubash · Mumbai, IN
Sanjay Podder · Thane, IN
Aditya Priyadarshi · Bengaluru, IN
Bargav Jayaraman · Hosur, IN

Key dates

Filing date	Dec 30, 2016
Grant date	Jul 2, 2019
Priority date	—
Expiry date	Jul 15, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3684
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A device may receive information identifying a first set of instructions. The first set of instructions may identify an action to perform to test a first program. The device may identify a second set of instructions, related to testing a second program, that can be used in association with the first set of instructions. The first test may be similar to the second test. The device may identify multiple steps, of the first set of instructions, that can be combined to form a third set of instructions. The third set of instructions may be used to test the first program or a third program. The device may generate program code in a first programming language to perform the action. The first programming language may be different than a second programming language used to write the first set of instructions. The device may perform the action.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.