Patent · US Active

Measurement method, electronic device, and measurement system

US10339284B2 · kind B2 · utility

0Cited by
6References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 16, 2016
Grant dateJul 2, 2019
Priority date
Expiry dateOct 11, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2221/2101
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A measurement method, an electronic device, and a measurement system where the electronic device reads, from a hardware storage device, running code and running data that are in a running process of a virtual machine manager (VMM), and generates first verification information according to the running code and the running data, and the electronic device stores the first verification information, and transmits, to a trusted data center, log information generated in a process that is from reading, by the electronic device, the running code and the running data to storing, by the electronic device, the first verification information such that the trusted data center measures the electronic device using the first verification information acquired from the electronic device and second verification information generated according to the log information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.