Semiconductor device and operation method thereof
US10340903B2 · kind B2 · utility
0Cited by
0References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2017 |
| Grant date | Jul 2, 2019 |
| Priority date | — |
| Expiry date | Oct 5, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00143
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Provided is a semiconductor device including a target circuit, a monitoring circuit, and a voltage controller. The target circuit includes a transistor. The monitoring circuit is configured to measure a temperature of the target circuit or measure a delay time between an input and an output of the target circuit. The voltage controller is configured to adjust a driving voltage for driving the target circuit or a back-bias voltage for adjusting a threshold voltage of the transistor by referring to at least one of the temperature and the delay time. As the temperature increases, the delay time decreases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.