Method for reshaping the characteristic exposure response and dosimetry of a direct radiography system
US10345454B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2016 |
| Grant date | Jul 9, 2019 |
| Priority date | — |
| Expiry date | Oct 18, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/265
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method for reshaping the characteristic exposure response and dosimetry of a direct radiography system into a specified exposure response profile includes pixel-wise converting image data according to a response transfer model which is derived from an x-ray generator's post exposure parameters data associated with image signals obtained at various exposure levels during system calibration and from a few extra dose measurements and their corresponding post exposure data also gathered during system calibration under reference exposure conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.