Multi-data analysis based proactive defect detection and resolution
US10346282B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2017 |
| Grant date | Jul 9, 2019 |
| Priority date | — |
| Expiry date | Dec 12, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/0282
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Multi-data analysis based proactive defect detection and resolution may include analyzing operational data for an application to determine whether a functionality related to the application is below a predetermined threshold associated with the functionality related to the application, and based on the analysis, generating an indication to perform defect analysis related to the functionality related to the application. A sentiment analysis may be performed on consumer data related to the application to determine a sentiment of the consumer data related to the application, and a natural language processing (NLP) analysis may be performed on the consumer data related to the application to determine a function associated with a negative sentiment. Application code and process data related to the application may be analyzed to determine a defect associated with the application. Further, a code of the application may be modified to correct the defect associated with the application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.