Patent · US Active

Wafer-scale integration of vacancy centers for spin qubits

US10347834B2 · kind B2 · utility

3Cited by
2References
35Claims
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Key dates

Filing dateMar 22, 2018
Grant dateJul 9, 2019
Priority date
Expiry dateMar 22, 2038

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/933
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Embodiments of the present disclosure propose two methods for integrating vacancy centers (VCs) on semiconductor substrates for forming VC-based spin qubit devices. The first method is based on using a self-assembly process for integrating VC islands on a semiconductor substrate. The second method is based on using a buffer layer of a III-N semiconductor material over a semiconductor substrate, and then integrating VC islands in an insulating carbon-based material such as diamond that is either grown as a layer on the III-N buffer layer or grown in the openings formed in the III-N buffer layer. Integration of VC islands on semiconductor substrates typically used in semiconductor manufacturing according to any of these methods may provide a substantial improvement with respect to conventional approaches to building VC-based spin qubit devices and may promote wafer-scale integration of VC-based spin qubits for use in quantum computing devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.