Patent · US Active

Probe clips for a coordinate measuring machine

US10352340B2 · kind B2 · utility

0Cited by

9References

20Claims

0Family size

Assignee

Hexagon Metrology, Inc. · US

Inventors

Gurpreet Singh · Alwar, IN
Paul Racine · Providence, US
John Langlais · West Greenwich, US
Jie Zheng · Mansfield, US

Key dates

Filing date	Mar 16, 2017
Grant date	Jul 16, 2019
Priority date	—
Expiry date	Jan 3, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01B21/047
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe clip allows easy and accurate placement of a probe clip onto a coordinate measuring machine (“CMM”). Moreover various probe clips are configured to movably and adjustably secure an optical probe to the CMM. To that end, the probe clip may have a probe seat, for holding the probe, movably coupled to a clamp segment by an adjustable joint. The clamp segment movably couples the probe seat to a probe platform on the CMM.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.